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Other articles related with "drain induced barrier thinning (DIBT)"：
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78502 |
Wen-Hao Zhang(张文豪), Zun-Chao Li(李尊朝), Yun-He Guan(关云鹤), Ye-Fei Zhang(张也非) |
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Double-gate-all-around tunnel field-effect transistor |
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Chin. Phys. B
2017 Vol.26 (7): 78502-078502
[Abstract]
(603)
[HTML 1 KB]
[PDF 429 KB]
(212)
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